LayTec has introduced a new in-line metrology system X Link that is designed to provide fast and accurate evaluation of the level of ethylene vinyl acetate (EVA) cross-linking directly after the module lamination process. It can be integrated in any c-Si or thin-film based solar module production line, and is claimed to offer 100% coverage for process and quality control.
LayTec’s in-line metrology system X Link evaluates EVA cross-linking non-destructively
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